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Probe Tips & Holders

Designed for reliable and accurate test of mmW, THz, and impedance tuner applications.
Z-SHAPE TEST TIP WITH TIP DIAMETER OF 1µ, THE RIGID TUNGSTEN BODY IS BENT IN A "Z" SHAPE FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
Z-SHAPE TEST TIP WITH TIP DIAMETER OF 5µ, THE RIGID TUNGSTEN BODY IS BENT IN A "Z" SHAPE FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
STRAIGHT TEST TIP WITH TIP DIAMETER OF 5µ, THE RIGID TUNGSTEN BODY CAN BE BENT AND / OR CUT FOR USE WITH SMALL WORKING DISTANCE OBJECTIVES.
LOW LEAKAGE ISOLATED <10fA COAX PROBE & HOLDER
DOUBLE TIP AVAILABLE FROM 5µ TO 12.5µ WITH SPACING OF 12.5µ TO 100µ
Economical - reliable and accurate test measurements of RF/DC/CV/High Power, MEMS,...devices.
Low leakage, Teflon isolated, 1pA coaxial probe tip holder with Screw Lock.
Low leakage, Ceramic isolate, high temperature, coaxial probe tip holder with Screw Lock.
Low leakage, delrin isolated, 10pA probe holder with Spring Clip.
Low leakage, Teflon isolated 1pA coaxial probe tip holder with Spring Clip.
Low Leakage ceramic isolated, high temperature, coaxial probe holder with Spring Clip.
Very low-leakage, isolated 2fA triaxial probe holder with Screw Lock.
Low leakage- Delrin isolated, 10pA coaxial probe tip holder with Screw Lock.
X-Y-Z ECONOMIC MICROPOSITIONER WITH 3 CONTROLS KNOBS, THE S-725 WILL ALLOW EASY LANDING ON PADS AND INTERNAL MICRON LINES .
AUTOMATED SHEET RESISTIVITY & TCR MEASUREMENT SYSTEM
For laboratory,research,and small production test runs.
STABLE 3-AXIS LEANEAR DIRECTION CONTROL MICROPOSITIONER WITH INDEPENDANT CONTROL KNOBS, .
FOR RELIABLE RESISTIVITY MEASUREMENTS ON A LARGE VERIETY OF MATERIALS AND SURFACES
Ultra-Stable micropositioner with inline control knobs, The SP-100 allows for easy probing on pads as well as internal lines with sub-micron accuracy.
High-precision micropositioner with inline control knobs, The SP-150 allows for easy probing on pads as well as internal lines with sub-micron accuracy.
100MM, 150MM,200MM MANUAL PROBE SYSTEM DESIGNED FOR RELIABLE AND ACCURATE ANALYTICAL TESTING OF DC, CV-IV, AND HIGH-POWER APPLICATIONS

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