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DIAGNOSTIC MULTI-TEST RESISTIVITY MEASUREMENT SYSTEM

Part Number

ΩPro

Title

DIAGNOSTIC MULTI-TEST RESISTIVITY MEASUREMENT SYSTEM

Applications

4-Point Measurements
Semi-Automatic Resistivity Test Systems
Thermal Coefficient of Resistance (TCR) Testing

Description

Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe,

Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes,

Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.

 

Documents
Technical Specifications
SAMPLE SIZE
10mm, 25mm, 50mm 75mm, 100mm, 150mm, 200mm, AND 300mm
RESISTIVITY RANGE
1 10µΩ to 100MΩ /sq
MOVEMENT
SEMI-AUTOMATIC
COMPATIBILITY
SP4,HT4 PROBE HEAD,2-POINT KELVIN PROBES, PROBE CARD
CONNECTION
USER SELECT
SOFTWARE
YES
TCR
YES-OPTIONAL
SMU
USER SELECT / KEITHLEY 2450 & 2600 SERIES TYPICAL

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