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Accessories For test Stations

100MM, 150MM,200MM MANUAL PROBE SYSTEM DESIGNED FOR RELIABLE AND ACCURATE ANALYTICAL TESTING OF DC, CV-IV, AND HIGH-POWER APPLICATIONS
FOR RELIABLE AND ACCURATE DC, CV/IV, HIGH POWER & RF TEST MEASUREMENTS
FOR RELIABLE, ACCURATE RF/DC/CV, AND HIGH-POWER TEST MEASUREMENTS
200MM SEMI-AUTOMATIC PROBE STATIONS FOR RELIABLE, ACCURATE RF/DC/CV AND HIGH-POWER TEST MEASUREMENTS
FOR RELIABLE, ACCURATE RF/DC/CV,AND HIGH-POWER ON WAFER TEST MEASUREMENTS
FOR RELIABLE, ACCURATE RF/DC/CV, AND HIGH-POWER TEST MEASUREMENTS
300mm Semi-Automatic probe station for reliable and accurate RF/DC/CV/High Power, thermal test measurements.
STEREOZOOM SCOPE WITH 6.7:1 ZOOM, LED ILLUMINATION, EYEPIECES, TRINOCULAR HEAD, CAMERA PORT WITH LONG WORKING DISTANCE
LOW TO HIGH MAG 1X-12X ZOOMING SCOPE WITH LONG WORKING DISTANCE AND CAMERA PORT
LOW TO HIGH MAG 1X-7X ZOOMING SCOPE WITH LONG WORKING DISTANCE CAMERA PORT AND OPTIONAL EYEPIECES
HIGH POWER MICROSCOPE WITH 4 OBJECTIVE TURRIT, CAMERA MOUNT, AND FIBER OPTIC ILLUMINATION
Board Mount Vice Chuck For Holding Individual Chips, Devices, Boards...
THERMAL CHUCK CONTROLLER FOR A VERIETY OF TEMPERATURE PROBING APPLICATIONS

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