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For over fifty years Signatone has offered a comprehensive line of superior analytical probe stations for on-wafer probing, increasing process performance while reducing cost. Accessories include microscopes, thermal control systems, software and a variety of probes.

Millimeter Wave On-Wafer RF Probing

Supports frequencies up to 1.1 THz

Compatible with Keysight-Agilent, Anritsu, Rohde & Schwarz VNA’s, frequency extenders from Keysight, Anritsu, OMLabs, VDI, Copper Mountain, and Rohde & Schwarz. ,

Cable and Waveguide interfacing with true 3-axis large-area positioning

Multi-Measurements - One Probe Station

Current-Voltage (I-V)

Capacitance-Voltage (C-V)

Pulse IV At Temperature

Complete Resistivity Measurement Systems

Reports standard resistivity, resistivity standard deviation, average sheet resistance, and sheet resistance standard deviation.

TCR Measurements and Dual configuration testing

Automated 2D & 3D contour mapping

Characterize High-Power Devices at the Wafer Level

The “PowerPro” power device characterization system enables safe and accurate over temperature, low contact resistance measurements of power semiconductors up to 3 kV (Triax) / 10 kV (Coax)

Accessories For Test Stations

Resistivity Test Systems

Probe Stations

Probe Tips & Holders

Micropositioners

Resistivity Testing

RF - Microwave Test Solutions

DC- CV/IV Analytical Probing

High Power Characterization

For over fifty years Signatone has offered a comprehensive line of superior analytical probe stations for on-wafer probing, increasing process performance while reducing cost. Accessories include microscopes, thermal control systems, software and a variety of probes.

Millimeter Wave On-Wafer RF Probing

Multi-Measurements - One Probe Station

Complete Resistivity Measurement Systems

Characterize High-Power Devices at the Wafer Level

Applications

Products

Signatone

For over fifty years Signatone has offered a comprehensive line of superior analytical probe stations for on-wafer probing, increasing process performance while reducing cost. Accessories include microscopes, thermal control systems, software and a variety of probes.

Millimeter Wave On-Wafer RF Probing

Multi-Measurements - One Probe Station

Complete Resistivity Measurement Systems

Characterize High-Power Devices at the Wafer Level

Applications

Products

Signatone

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