Leading the Way in Analytical Probe Stations
For over fifty years Signatone has offered a comprehensive line of superior analytical probe stations for on-wafer probing, increasing process performance while reducing cost. Accessories include microscopes, thermal control systems, software and a variety of probes.
Products
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Increasing process performance
while reducing cost.
Superior analytical probe stations for
on-wafer probing.
Applications
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Signatone Continues to Advance
With a focus on RF-HF markets, EV testing, and material research solutions, we maintain our commitment to innovation while remaining responsive to evolving industry dynamics.
Millimeter Wave On-Wafer RF Probing
- Supports frequencies up to 1.1 THz
- Compatible with Keysight-Agilent, Anritsu, Rohde & Schwarz VNA’s, frequency extenders from Keysight, Anritsu, OMLabs, VDI, Copper Mountain, and Rohde & Schwarz.
Cable and Waveguide interfacing with true 3-axis large-area positioning - Cable and Waveguide interfacing with true 3-axis large-area positioning
Multi-Measurements - One Probe Station
- Current-Voltage (I-V)
- Capacitance-Voltage (C-V)
- Pulse IV At Temperature
Complete Resistivity Measurement Systems
- Reports standard resistivity, resistivity standard deviation, average sheet resistance, and sheet resistance standard deviation.
- TCR Measurements and Dual configuration testing
- Automated 2D & 3D contour mapping
Characterize High-Power Devices at the Wafer Level
- The “PowerPro” power device characterization system enables safe and accurate over temperature, low contact resistance measurements of power semiconductors up to 3 kV (Triax) / 10 kV (Coax)
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Address:
- 123 Main Street, Anytown, USA