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AUTOMATED SHEET RESISTIVITY MEASUREMENT AND MAPPING SYSTEM

Part Number

QUADPRO 2

Title

AUTOMATED SHEET RESISTIVITY MEASUREMENT AND MAPPING SYSTEM

Applications

4-Point Measurements
Thermal Coefficient of Resistance (TCR) Testing
Semi-Automatic Resistivity Test Systems

Description

Automated sheet resistivity measurement systems for laboratory, research, and small productions.
Measures V/I, Sheet Resistance, Resistivity or Thickness Reports Average, Standard Deviation, Minimum, Maximum and
1Sigma for the data set Temperature Coefficient of Resistance (TCR) measurements integrated with automated temperature chuck and source meter (Optional), Automated 2D Color Contour mapping, 3D and Cross section mapping employs the Dual Configuration Testing method for improved accuracy and repeatability, tests samples 10mm to 300mm, P/N Typing, Comparative Mapping.

Documents
Technical Specifications
SAMPLE SIZE
10mm, 25mm, 50mm 75mm, 100mm, 150mm, 200mm, AND 300mm
RESISTIVITY RANGE
10 Micro ohm/sq to 100 Mega ohm/sq
MOVEMENT
SEMI-AUTOMATIC
CONTACT/SEPARATE
USER SELECT /5mm TYPICAL
COARSE Z ADJUST
USER SELECT / 1mm-100mm
COMPATIBILITY
SP4 or HT4 PROBE HEAD
CONNECTION
9-PIN STANDARD
SOFTWARE
YES
TCR
YES-OPTIONAL
SMU
USER SELECT / KEITHLEY 2450 & 2600 SERIES TYPICAL

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