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COMPUTER AIDED PROBE SUM-MICRON MICROPOSITIONER

Part Number

CAP-946

Title

COMPUTER AIDED PROBE SUM-MICRON MICROPOSITIONER

Applications

Automated Probing
Low Current Analysis
MEMS Probing
Thermal Characterization

Description

CONTROLLED BY COMPUTER AND/OR BY JOYSTICK – THUMB WHEELS, THE CAP PROBES HAVE BUILT-IN MICRO-MOTORS AND ARE SPECIFICALLY DESIGNED FOR THE CHECKMATE SERIES OF SUB-MICRONIC PROBE STATIONS.

  • DIRECT PLUG IN TO ANY MODEL OF THE CHECKMATE SERIES (1-4 )
  • ALLOWS AUTOMATIC “HANDS-OFF” TEST SUB-ROUTINES INSIDE A DIE OR WHEN A PROBECARD IS USED TO POLARIZE THE DEVICE IN VIEW OF TESTING ITS INTERNAL NODES
  • AVAILABLE IN RF VERSION
Documents
Technical Specifications
ACCURACY
>1 MICRON
X-AXIS MOTION
25 mm
Y-AXIS MOTION
22 mm
Z-AXIS MOTION
12.5 mm
RESOLUTION
0.1 Micron
CONTROL
SOFTWARE, JOY STICK, THUMBWHEELS
MOUNTING BASE STYLE
MAGNETIC OR BOLT DOWN
HEAD STYLE
PIVOT HEAD OR THREE HOLE RF/HC/MT/4PP MOUNT

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