The FP100 is used for many applications that require a fast and accurate probe. Designed for two point testing applications on packaged devices, PC boards or wafers often requires fast movement between probe contacts to complete the overall test in a reasonable amount of time. ESD two point tests, open/short test and continuity test all have short term test times between two points. However, these tests often have a large number of contacts that all need to be verified. The FP-100 accommodates these requirements.
The FP-100 has an X-Y range of 100mm which accommodates individual die on a wafer, most packaged circuits and many PC boards. The 12mm Z range allows probing of various topography as found on PC boards loaded with chips and devices. The FP-100s bolt onto the probe station to assure stability and are driven by linear precision motors with 0.5μ resolution.