Signatone’s Arctic Cold Chucks are used for test, characterization, and failure analysis of semiconductor wafers and components at hot and cold temperatures. The system includes a temperature controlled chuck and a self contained chiller with sophisticated PID controller. Chucks are available in 6” and 8” diameters. Options include triaxial guarding, dew point monitors and air dryers. The Arctic Temperature Chucks have many advanced design features which ensure excellent thermal, electrical, and mechanical performance with high reliability.
Signatone Probe Stations
Signatone offers a wide array of probe stations that can accept the Arctic Hot / Cold Chuck systems. Probe stations can incorporate Signatone’s local chamber that provides a dry and shielded environment directly around the wafer chuck area, eliminating the need to purge the volume of a large dark box. Signatone also offers triaxial technology probes that complete the low current probing package for making measurements into the femtoamp range using instruments such as the HP4156A parametric test system.
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